TF-151

Semiconductor Device Test Set

NSN 6625-00-100-8976

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
N/A
UOM:
1 EA
NIIN:
001008976

Detail Specifications

Width:
7.500 inches
Ac Voltage Rating:
Between 110.0 volts and 130.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Depth:
6.000 inches
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Beta gain; field effect
Operating Test Capability:
Transistor bi-polar testing beta range from low power of 1 to high power of 500 and field effect transistor mutual conductance range from 0 to 50000 micromhos
Phase:
Single
Height:
9.500 inches
NSN:
6625-00-100-8976
Item Name:
Test Set,crystal Diode
Cage Code:
33347

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
99
User:
ENVIRONMENTAL PROTECTION AGENCY Environmental Protection Agency
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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