TF46

Semiconductor Device Test Set

NSN 6625-01-058-9564

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

NIIN:

010589564

Product Features

Also called portable super cricket; no set-up required, connect test leads in any order, rotate test switch, if device is good, hear a chirp; push button for gain, helpful in troubleshooting as well as matching transistors & fet's; order probe 39g85 separately for testing pc boards

Technical Specifications of NSN

Inclosure Feature:

Single item w/housing

Test Type For Which Designed:

Go/no go test in or out of circuit test for all transistors & fet's

Part Name Assigned By Controlling Agency:

Test se semiconductive device also called portable super cricket

Functional Classification:

Aa-9.3

Supplementary Features:

Manufacturers name: transistor test set

NSN:

6625-01-058-9564

Item Name:

Test Set,diode Semiconductor Device

Cage Code:

33347

Other Related Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

219A

Cage Code:

11530

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

KT1

Cage Code:

05234

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

960

Cage Code:

08098

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

505

Cage Code:

58880

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

600.0000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

85.0

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Diode Semiconductor Device Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.