A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5930-00-253-4369
NSN 5950-00-939-8067
NSN 6105-00-574-8018
NSN 5950-00-216-9212
NSN 6220-01-135-3841
NSN 6135-01-110-9470
NSN 7035-01-412-3692
NSN 5945-01-436-1190
NSN 5925-01-028-6504
NSN 5975-01-572-6724
NSN 6150-01-548-7234
NSN 5915-01-121-3453