A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6685-01-426-8929
NSN 6685-01-406-5348
NSN 5999-01-436-0857
NSN 6645-01-208-1731
NSN 6610-01-107-8993
NSN 6105-01-320-1138
NSN 5905-01-332-4364
NSN 5999-00-354-4613
NSN 6240-01-123-9040
NSN 6645-01-275-8436
NSN 5945-01-400-5928
NSN 6220-01-261-2488