A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6620-01-065-4527
NSN 5965-00-215-5866
NSN 6610-01-022-2474
NSN 6150-01-119-3436
NSN 6130-00-266-7496
NSN 6110-01-514-6345
NSN 5990-01-346-8782
NSN 6650-01-534-2391
NSN 6650-00-518-5194
NSN 6620-00-797-2591
NSN 5930-01-397-2639
NSN 6105-00-846-9445