A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5960-01-204-5820
NSN 6685-00-678-2948
NSN 5930-01-544-0057
NSN 5990-01-651-0170
NSN 6645-01-364-7330
NSN 5975-00-101-5495
NSN 5998-01-181-5312
NSN 4140-00-223-8607
NSN 5895-00-244-6750
NSN 5930-00-619-1054
NSN 4140-01-586-5845
NSN 5925-00-429-9859