TRACKER4000

Semiconductor Device Test Set

NSN 6625-01-469-3173

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
UOM:
NIIN:
014693173

Detail Specifications

NSN:
6625-01-469-3173
Item Name:
Test Set,crystal Diode
Cage Code:
57705

Manufacturer Part Numbers

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
31-0089
Cage Code:
57705
RNCC:
5
RNVC:
2
RNAAC:
9Z
Status:
A
MSDS:
SADC:
Part Number:
4000
Cage Code:
57705
RNCC:
5
RNVC:
2
RNAAC:
9Z
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:

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Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
FRANCE France
DSOR:
User:
NORWAY Norway
DSOR:
User:
TURKEY Turkey
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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