A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6110-01-322-4439
NSN 5855-01-430-9689
NSN 5965-01-205-6249
NSN 6650-01-119-4576
NSN 5965-01-373-8858
NSN 5960-01-567-1096
NSN 6145-01-350-3532
NSN 5965-01-339-0059
NSN 5895-01-421-2150
NSN 5855-01-442-5401
NSN 4140-01-333-7876
NSN 4140-00-569-4096