A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6220-01-109-0512
NSN 5999-01-010-3221
NSN 5930-01-415-5103
NSN 5990-00-655-0986
NSN 6145-00-677-0140
NSN 5975-01-192-0727
NSN 5965-01-356-4426
NSN 5985-01-278-4360
NSN 5999-01-290-4850
NSN 4140-01-464-0711
NSN 5999-01-612-5220
NSN 5835-00-833-7080