TS268EU

Semiconductor Device Test Set

NSN 6625-00-923-6534

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

UOM:

NIIN:

009236534

Detail Specifications

Width:

6.000 inches

Length:

8.187 inches

Internal Battery Accommodation:

Included

Inclosure Feature:

Single item w/carrying case

Test Type For Which Designed:

Front resistance of crystal; back resistance of crystal; back current of crystal

Operating Test Capability:

Front resistance-not greater than 0.5 kilohm for a good crystal; back resistance-ratio of back to front resistance greater than 10 to 1 for a good crystal; back current-crystal should not indicate current greater than - crystal in21 and in23, in23a, in25, in21a and in23b, in21b, in26 we, in26 syl, in78 syl - current d. C. 0.400 ma, 0.300 ma, 0.250 ma, 0.175 ma, 0.125 ma, 0.110 ma, 0.230 ma, 0.160 ma

Height:

3.625 inches

NSN:

6625-00-923-6534

Item Name:

Test Set,crystal Diode

Cage Code:

94518

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

RATING VARIABLE

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.