TS6789

Test Probe

NSN 6625-01-086-3130

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

NIIN:

010863130

Detail Specifications

Overall Length:

9.000 inches

Overall Height:

1.438 inches

Overall Width:

4.500 inches

Handle Material:

Plastic

Furnished Items And Quantity:

Cable 1

Tip Termination Type:

Clamp around

Conductor Attachment Method:

Standard dual banana plug

Color:

Black

Fsc Application Data:

Test set, electronic equipment

NSN:

6625-01-086-3130

Item Name:

Probe Head Assembly

Cage Code:

H1200

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

CG-100A

Cage Code:

18479

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

Y8100

Cage Code:

89536

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

400-4666

Cage Code:

A486G

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

1.5000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Probe Head Assembly"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.