TT22

Semiconductor Device Test Set

NSN 6625-00-902-9562

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
UOM:
NIIN:
009029562

Detail Specifications

Width:
5.500 inches
Length:
8.000 inches
Dc Voltage Rating:
1.6 volts
Major Components:
Cable assembly device; lead, test; adapter, crystal socket
Accessory Component Quantity:
1 and 1 and 1
Accessory Controlling Agency:
Abbey electronics corporation and abbey electronics corporation and abbey electronicscorp
Accessory Identifying Number:
A2262006 part no. And a2262007 part no. And a2202047 part no.
Joint Electronics Type Designation System Item Name:
Test set, semiconductor device
Joint Electronics Type Designation System Item Type Number:
Type no. Ts-2086/u
Internal Battery Accommodation:
Included
Material And Location:
Plastic housing
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Incircuit - saturation voltage and resistance of transistors, diode and scr forwatd, characteristics out-of-circuit, saturation voltage and resistance of transistors, diode and scr forward, charactereistics, transistor current gain, transistor leakage current, reverse characteristics of diodes and scrs
Operating Test Capability:
Saturation voltage - 0.3v, 0-3v saturation resistance -0-10 x1, x10, x100, collector test current - 2.5, 25, 250 ma reverse leakage current - 0-30, va, 0.3 ma, 0-30ma, 0-300 ma, current grain, beta - 1-30, 10-300, accuracy - porm 5 pct in-circuit, porm 3 pct out-of-circuit
Height:
5.750 inches
Surface Treatment:
Paint
Surface Treatment:
Paint
Fsc Application Data:
Electrical and electronic properties measuring and testing instruments
NSN:
6625-00-902-9562
Item Name:
Test Set,crystal Diode
Cage Code:
14558

Manufacturer Part Numbers

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
TS2086U
Cage Code:
80058
RNCC:
5
RNVC:
2
RNAAC:
XX
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
85.0
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
BRAZIL Brazil
DSOR:
User:
SPAIN Spain
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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