U161-02

Semiconductor Device Test Set

NSN 6625-00-438-9116

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

NIIN:

004389116

Product Features

Parameter readout; 3-collector supply modes; auto positioning & polarity tracking; pulsed base operation; calibrated display offset w/magnifier; kelvin sensing for high current tests; protective featrues for operator & device; quick-change line-voltage range/6-positions

Technical Specifications of NSN

Width:

11.500 inches

Ac Voltage Rating:

Between 90.0 volts and 272.0 volts

Frequency Rating:

Between 48.0 hertz and 66.0 hertz

Depth:

23.000 inches

Electrical Power Source Relationship:

Operating

Inclosure Feature:

Single item w/housing

Test Type For Which Designed:

Fault isolation

Phase:

Single

Height:

15.000 inches

Reference Data And Literature:

1969 tektronix catalog and to 33a1-13-401-1

Supplementary Features:

Manufacturers name: curve tracer

NSN:

6625-00-438-9116

Item Name:

Test Set,transistor

Cage Code:

F5326

Other Related Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

576

Cage Code:

80009

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

36.5 X 26.5 X 19.0

Paclk Weight:

105.0000lbs

Item Weight:

70.0000lbs

Item Dim:

025001500120

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

F000003XE9

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

100.0

WCC:

72D

TCC:

SHC:

ACC:

Equipment for Aircraft

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Transistor Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.