0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6645-01-500-0827
NSN 5905-00-258-9122
NSN 2925-01-151-6969
NSN 6105-01-444-3849
NSN 6685-01-498-9983
NSN 5920-00-173-4434
NSN 5835-00-823-6116
NSN 5960-00-240-7727
NSN 5910-01-481-1515
NSN 5915-00-243-9589
NSN 5930-01-173-9177
NSN 5925-01-029-3483