0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5935-01-256-5163
NSN 5990-01-643-4167
NSN 5998-00-716-7638
NSN 2925-00-973-2574
NSN 5930-01-406-4281
NSN 6240-01-004-3464
NSN 5855-00-089-3974
NSN 6150-00-635-1793
NSN 5975-01-649-8168
NSN 6685-00-285-3272
NSN 5910-01-501-0652
NSN 5930-00-307-1593