A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5960-01-599-9821
NSN 5925-01-561-0733
NSN 5905-00-152-6426
NSN 6240-00-177-0385
NSN 5930-00-452-9187
NSN 5950-01-377-9238
NSN 5915-01-212-7957
NSN 6130-01-321-5855
NSN 6620-01-016-8264
NSN 6145-01-631-3941
NSN 2925-01-197-7864
NSN 5960-01-100-5065