A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6685-00-803-6421
NSN 5990-01-557-7784
NSN 5895-01-449-0447
NSN 5910-01-060-5910
NSN 6135-00-062-5080
NSN 6240-00-156-1607
NSN 6130-00-643-4894
NSN 5855-01-027-1571
NSN 5910-01-090-0453
NSN 5855-00-832-9341
NSN 5905-01-350-3624
NSN 5990-01-442-3520