A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5855-01-154-1402
NSN 5990-00-552-1611
NSN 5920-01-497-1877
NSN 6610-01-442-3509
NSN 6220-00-655-2863
NSN 6130-01-273-0944
NSN 5960-01-056-4982
NSN 5990-01-433-3786
NSN 5990-00-518-3195
NSN 6150-01-475-4290
NSN 5905-01-511-5435
NSN 6620-01-230-0197