0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5910-00-238-6903
NSN 6220-00-253-3836
NSN 6685-00-602-7209
NSN 7035-01-547-5361
NSN 5990-00-033-8128
NSN 7035-01-245-7973
NSN 6240-01-166-4517
NSN 6620-01-189-8153
NSN 6650-01-643-0534
NSN 6645-01-091-0009
NSN 6650-00-088-4741
NSN 6645-00-099-6913