0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6220-00-299-4634
NSN 5990-01-577-2120
NSN 6240-01-126-9167
NSN 6105-01-569-0750
NSN 6610-01-278-2446
NSN 6110-01-019-7987
NSN 5925-00-241-0113
NSN 5950-01-221-3470
NSN 7035-00-185-8683
NSN 5945-01-634-0588
NSN 5950-01-210-9177
NSN 2925-01-259-7092