0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6220-00-635-8818
NSN 5895-00-842-4416
NSN 6145-01-488-6583
NSN 6620-01-391-9829
NSN 5950-01-196-6317
NSN 5930-01-394-4964
NSN 5990-00-105-7096
NSN 6685-00-732-8357
NSN 2925-00-139-0720
NSN 5998-01-321-2690
NSN 6320-01-345-5818
NSN 6130-00-521-1414