A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 5950-01-557-4206
NSN 6110-00-442-3497
NSN 6220-01-350-8014
NSN 5925-01-079-8417
NSN 5996-00-338-7089
NSN 5895-01-282-9105
NSN 5895-00-593-4806
NSN 5998-01-199-4132
NSN 5965-01-461-6071
NSN 6650-01-621-5050
NSN 4140-01-446-0339
NSN 5975-01-187-6790