A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 7035-01-312-8573
NSN 7035-00-252-7467
NSN 5985-00-277-7371
NSN 5910-00-238-2934
NSN 6610-01-033-2402
NSN 4140-01-596-3620
NSN 5965-01-107-8549
NSN 5960-01-438-0245
NSN 5915-00-080-1236
NSN 6110-00-699-1495
NSN 5950-00-098-5138
NSN 6130-01-247-7942