A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6620-00-758-0797
NSN 5905-01-578-7330
NSN 5950-01-027-1459
NSN 5965-01-464-3372
NSN 6320-01-436-9228
NSN 5925-00-597-1558
NSN 6240-00-252-7138
NSN 5835-01-501-0526
NSN 6240-00-072-9966
NSN 5920-01-318-0756
NSN 6650-01-416-0473
NSN 5925-01-214-4130