A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6645-01-114-8044
NSN 5996-01-255-0397
NSN 6220-00-284-3220
NSN 5910-00-145-9959
NSN 5998-01-634-0604
NSN 5950-01-292-2687
NSN 5910-00-175-8626
NSN 6145-01-123-7019
NSN 5996-01-387-9664
NSN 6130-01-425-1977
NSN 6650-00-412-5988
NSN 5990-01-074-6549