A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5945-00-574-8272
NSN 5999-01-333-5043
NSN 6620-00-498-1553
NSN 5998-00-612-2693
NSN 5999-01-262-2957
NSN 6220-00-248-5511
NSN 5855-01-020-7982
NSN 6145-01-377-5130
NSN 6135-00-877-1659
NSN 6610-00-007-1527
NSN 6240-00-627-9007
NSN 5998-00-052-9235