A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6105-01-390-1626
NSN 5950-00-123-5831
NSN 5975-01-159-2149
NSN 6145-01-658-4381
NSN 5895-01-389-1166
NSN 5975-00-160-2407
NSN 6130-01-266-3691
NSN 6110-01-026-4010
NSN 5935-00-391-5539
NSN 5985-01-507-5178
NSN 5905-00-146-7043
NSN 5935-00-518-3576