A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6685-01-029-3773
NSN 5998-00-783-6107
NSN 5965-01-067-9280
NSN 5920-00-939-2203
NSN 5990-00-150-6979
NSN 6685-01-104-3708
NSN 6130-01-568-9682
NSN 6110-01-340-9424
NSN 7035-01-346-8800
NSN 5915-00-389-1126
NSN 6135-00-269-5843
NSN 5999-01-305-3012