A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6685-01-407-8675
NSN 6105-00-065-2253
NSN 5930-00-901-6270
NSN 5996-01-030-6656
NSN 6145-01-170-3797
NSN 7035-00-173-2281
NSN 6650-00-518-5194
NSN 5895-00-594-4308
NSN 5835-01-067-9271
NSN 6320-00-521-9350
NSN 5950-01-328-8983
NSN 6685-01-455-0025