A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 5990-00-979-8141
NSN 5935-01-100-3661
NSN 5999-00-307-3125
NSN 5960-00-409-3221
NSN 5999-01-090-1198
NSN 5920-01-160-0057
NSN 6135-01-067-8331
NSN 5965-01-499-7318
NSN 5895-01-205-1515
NSN 5920-00-669-9868
NSN 5965-01-534-6396
NSN 5998-01-513-8815