A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6240-01-459-0902
NSN 5985-01-195-1413
NSN 5935-00-883-1291
NSN 5920-00-075-5726
NSN 5925-00-961-5333
NSN 7035-01-176-7523
NSN 6110-00-825-1652
NSN 6320-01-170-4068
NSN 5985-00-337-5715
NSN 6240-01-475-2642
NSN 6220-01-432-0089
NSN 6150-01-317-4681