A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5920-01-291-2325
NSN 6135-01-384-7155
NSN 5945-01-131-1969
NSN 5960-00-683-7476
NSN 5930-01-367-1642
NSN 5935-01-204-6102
NSN 5920-01-213-0379
NSN 6220-01-060-1096
NSN 5835-01-442-6482
NSN 5930-00-171-0141
NSN 6620-00-078-4470
NSN 5975-01-591-0202