A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6105-00-932-5309
NSN 6650-01-338-3823
NSN 5910-00-370-2471
NSN 6135-01-579-3534
NSN 5960-01-308-0539
NSN 6130-01-517-4274
NSN 6105-01-391-7092
NSN 4140-01-140-6781
NSN 5935-01-021-6034
NSN 6105-01-134-9346
NSN 2925-00-105-3907
NSN 5855-01-254-3041