A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6240-01-085-6576
NSN 5950-01-442-8009
NSN 6110-01-486-4604
NSN 5975-01-454-1601
NSN 5835-00-670-2925
NSN 5925-00-377-0263
NSN 5950-00-021-7143
NSN 6135-01-457-2855
NSN 6645-00-716-8049
NSN 5935-00-503-2695
NSN 6150-00-546-2334
NSN 5960-01-135-0463