A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5990-01-525-2250
NSN 6105-00-180-7285
NSN 5999-00-610-3265
NSN 5996-00-186-8709
NSN 6145-01-214-8810
NSN 6110-01-543-0282
NSN 4140-01-634-0330
NSN 7035-00-238-3662
NSN 6645-01-438-6986
NSN 5835-01-424-0054
NSN 2925-01-423-3003
NSN 6135-01-119-0720