A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6135-01-222-0703
NSN 5915-01-185-2897
NSN 6130-00-683-1011
NSN 5910-01-619-9468
NSN 6620-00-689-4456
NSN 5930-01-617-1683
NSN 4140-00-621-9226
NSN 6135-01-521-7693
NSN 6320-01-322-8340
NSN 5996-01-090-4683
NSN 5935-00-468-7447
NSN 5910-01-504-5480