Digital test subsystem slot p3 i/o channel card module
An electronic subassembly designed to be plugged into one or more basic pieces of test equipment to extend the capabilities of the basic instrument. the basic instrument cannot function without one or more plug-in units (as required) in position.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 7035-01-162-7452
NSN 6320-00-500-4172
NSN 4140-01-386-8914
NSN 5895-01-192-1190
NSN 5905-01-188-9911
NSN 6105-00-248-5772
NSN 6645-00-139-9239
NSN 2925-01-408-6205
NSN 6240-01-406-5345
NSN 5935-01-497-6814
NSN 6130-01-526-6317
NSN 5950-01-240-3265