Digital test subsystem slot p3 i/o channel card module
An electronic subassembly designed to be plugged into one or more basic pieces of test equipment to extend the capabilities of the basic instrument. the basic instrument cannot function without one or more plug-in units (as required) in position.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5910-01-371-2865
NSN 5975-00-264-6746
NSN 6145-00-370-1964
NSN 7035-01-073-5233
NSN 5999-01-134-7328
NSN 5925-01-633-1111
NSN 5985-01-191-0898
NSN 5855-01-165-6361
NSN 4140-00-274-9638
NSN 5965-01-505-8639
NSN 6320-00-186-6452
NSN 7035-00-870-0290