Digital test subsystem slot p3 i/o channel card module
An electronic subassembly designed to be plugged into one or more basic pieces of test equipment to extend the capabilities of the basic instrument. the basic instrument cannot function without one or more plug-in units (as required) in position.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5965-01-215-0993
NSN 6220-01-072-4883
NSN 6620-01-232-0680
NSN 6650-01-114-6019
NSN 6685-00-824-7910
NSN 5915-00-309-0514
NSN 6620-00-905-6590
NSN 5985-01-465-1265
NSN 5950-01-089-9860
NSN 5855-01-203-4719
NSN 5855-01-411-3360
NSN 5950-01-506-0303