A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6220-00-878-7301
NSN 6620-01-172-3500
NSN 6620-01-027-6658
NSN 7035-01-062-1692
NSN 6135-01-610-7335
NSN 6130-00-269-8273
NSN 5855-01-462-2628
NSN 6135-01-222-0703
NSN 6110-01-270-2938
NSN 5930-01-197-7372
NSN 5999-01-448-1584
NSN 5960-01-544-1273