A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6610-01-365-6504
NSN 5985-01-186-8404
NSN 6240-01-227-4178
NSN 6620-00-106-9658
NSN 7035-01-595-5270
NSN 2925-01-504-3058
NSN 5835-00-483-1895
NSN 5930-01-598-1259
NSN 5950-00-967-3649
NSN 5999-00-740-1300
NSN 6105-00-814-2862
NSN 5895-01-345-5954