0.378 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6220-01-607-1917
NSN 6320-01-308-0009
NSN 5855-00-118-8762
NSN 5855-01-409-1792
NSN 5985-01-626-8375
NSN 6620-00-349-4703
NSN 6610-00-575-7933
NSN 5920-01-374-5419
NSN 5950-01-037-1922
NSN 5999-01-579-9977
NSN 5835-01-380-5943
NSN 6620-00-546-6071