0.299 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5999-01-570-5623
NSN 5835-00-954-1190
NSN 5975-00-882-6205
NSN 5985-01-220-2678
NSN 6105-01-274-0617
NSN 5935-00-375-0736
NSN 6135-00-377-9165
NSN 2925-00-915-1827
NSN 4140-00-050-8456
NSN 5855-00-688-9954
NSN 5905-00-172-3490
NSN 5985-01-442-4642