0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6220-01-496-0539
NSN 5960-01-474-4843
NSN 5920-01-158-4517
NSN 5910-00-224-6319
NSN 6105-01-559-7538
NSN 6130-01-162-2310
NSN 5960-01-425-1454
NSN 6145-00-868-8763
NSN 5996-01-423-5630
NSN 5835-00-958-6231
NSN 6150-01-448-1048
NSN 6130-00-981-1600