0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5835-01-514-5758
NSN 6105-01-628-2084
NSN 5950-01-316-7368
NSN 5985-01-421-5029
NSN 6645-01-441-0937
NSN 5999-01-050-7854
NSN 6620-01-126-7019
NSN 6240-01-270-2915
NSN 5920-01-026-9167
NSN 6220-00-358-9580
NSN 5965-01-453-7504
NSN 5996-01-506-1764