0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5895-00-905-5730
NSN 7035-01-145-5059
NSN 5990-00-138-2730
NSN 5975-01-347-6404
NSN 6685-01-476-4867
NSN 5998-01-452-9111
NSN 5915-00-752-4458
NSN 5998-00-724-1643
NSN 5930-01-178-2328
NSN 6135-01-243-5797
NSN 6110-00-301-4874
NSN 6685-00-294-6315