0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5920-01-481-0421
NSN 5975-01-312-5552
NSN 7035-01-462-8701
NSN 6645-01-488-5466
NSN 6105-01-149-9163
NSN 5905-00-103-5237
NSN 6685-01-629-2170
NSN 5930-01-311-0613
NSN 7035-00-541-8516
NSN 7035-00-541-8516
NSN 6145-01-076-7065
NSN 6645-01-132-1862