0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5965-00-043-3463
NSN 7035-00-916-9380
NSN 5935-00-167-8028
NSN 5895-01-188-3424
NSN 5960-00-078-9500
NSN 5998-01-022-2232
NSN 6620-01-633-8443
NSN 6650-00-824-0745
NSN 5945-01-233-7355
NSN 5910-01-409-2852
NSN 5996-01-421-3868
NSN 5935-00-873-0954