0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5960-01-013-9346
NSN 6220-01-152-2637
NSN 6620-00-350-5817
NSN 5855-01-589-9339
NSN 5920-01-132-7482
NSN 6610-01-562-0846
NSN 6240-01-227-4178
NSN 6135-00-432-8779
NSN 6645-01-040-8337
NSN 5920-00-732-6763
NSN 5999-00-404-1634
NSN 5945-00-010-8336