0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5935-01-620-9822
NSN 2925-01-253-6006
NSN 5835-01-498-9410
NSN 5915-01-013-8995
NSN 6645-01-530-3654
NSN 6645-01-500-5611
NSN 5985-00-955-0722
NSN 4140-01-184-3488
NSN 5895-00-929-6885
NSN 5996-00-389-7404
NSN 6610-00-960-9135
NSN 7035-01-394-1324