0.450 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 4140-01-415-6013
NSN 6645-00-348-2841
NSN 5920-00-839-8096
NSN 5920-01-633-7286
NSN 5910-01-605-2233
NSN 5895-01-341-4962
NSN 6685-00-499-9233
NSN 5996-00-551-1097
NSN 5950-01-150-2773
NSN 5950-01-274-8938
NSN 6220-00-930-5678
NSN 6135-01-633-8502