0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5930-00-266-8175
NSN 4140-00-283-6843
NSN 5930-01-406-5243
NSN 5998-01-543-4381
NSN 5950-01-618-8143
NSN 6685-01-536-2538
NSN 5855-00-779-2854
NSN 6220-00-197-3102
NSN 6320-01-425-1417
NSN 6130-01-433-2215
NSN 6685-01-464-8589
NSN 6105-01-352-1853