0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6110-01-387-2900
NSN 5990-01-081-0619
NSN 5905-00-115-3560
NSN 6620-00-273-8735
NSN 6150-01-106-0989
NSN 5930-01-400-6126
NSN 5930-00-269-4996
NSN 2925-01-348-8306
NSN 5950-00-549-4313
NSN 6220-00-762-8944
NSN 6645-01-432-1068
NSN 5960-01-177-0338