0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5985-01-650-7587
NSN 5996-01-074-8161
NSN 2925-01-139-5144
NSN 6110-01-509-4444
NSN 5950-01-396-2065
NSN 5855-01-604-9997
NSN 6320-00-295-2854
NSN 5930-00-648-6354
NSN 6105-01-484-8516
NSN 5950-01-557-4828
NSN 5930-01-435-3428
NSN 5855-01-391-7077