0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5895-01-159-4079
NSN 5935-00-204-0075
NSN 5920-00-291-1379
NSN 5950-01-011-8453
NSN 5920-00-855-5314
NSN 6110-01-090-2583
NSN 6130-00-146-8009
NSN 5835-00-409-8355
NSN 5960-01-344-2604
NSN 5999-01-086-6245
NSN 6110-00-454-2074
NSN 6135-01-487-6275