0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5996-01-642-1095
NSN 5905-00-156-7154
NSN 5985-01-210-3420
NSN 5920-00-341-6340
NSN 5998-00-740-7515
NSN 5950-00-660-9497
NSN 6620-00-917-5259
NSN 5965-00-103-5000
NSN 7035-00-981-7216
NSN 5935-01-199-7026
NSN 6150-01-009-1335
NSN 5950-00-737-0678