0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5945-01-394-7242
NSN 5855-01-425-1330
NSN 5950-01-200-1711
NSN 5996-01-519-7548
NSN 7035-00-442-1869
NSN 6610-01-460-8898
NSN 6645-00-153-3834
NSN 6135-00-276-7625
NSN 4140-00-185-2993
NSN 6145-00-071-1154
NSN 6650-01-534-5787
NSN 5855-01-280-9735