0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5835-01-321-7895
NSN 6620-00-754-4914
NSN 6685-01-328-3535
NSN 5905-00-071-1293
NSN 5998-01-235-3502
NSN 4140-00-993-0071
NSN 6135-00-351-8606
NSN 5895-01-504-6871
NSN 5975-00-192-7503
NSN 6685-00-894-4516
NSN 5915-00-512-9143
NSN 6685-00-127-0934