0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6650-00-263-3552
NSN 6645-01-495-0939
NSN 6135-00-318-8359
NSN 6610-01-312-8340
NSN 5835-01-015-4610
NSN 5905-01-660-7871
NSN 5985-00-126-3923
NSN 5985-00-618-4745
NSN 5905-01-231-8791
NSN 5920-01-414-6983
NSN 5925-01-345-1422
NSN 5895-00-817-5224