0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5855-01-077-3285
NSN 5855-00-879-5849
NSN 6130-00-093-5863
NSN 6320-00-036-3688
NSN 5945-01-546-3057
NSN 5975-01-339-2140
NSN 5985-01-403-2835
NSN 5950-01-079-9046
NSN 6610-01-415-5877
NSN 5895-01-025-0409
NSN 6685-01-168-2916
NSN 6135-01-238-2878