0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5915-00-491-2624
NSN 5965-01-528-4531
NSN 5935-00-100-0101
NSN 5950-00-100-6737
NSN 4140-00-185-9694
NSN 6150-00-738-4316
NSN 5996-01-657-2029
NSN 5985-00-285-0798
NSN 6240-01-445-4232
NSN 5905-01-157-9933
NSN 7035-01-290-7174
NSN 5910-01-622-5674