0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5975-00-199-4956
NSN 6685-01-302-9728
NSN 6620-01-155-4014
NSN 5950-01-267-9931
NSN 6685-00-822-6923
NSN 4140-01-606-1883
NSN 5945-00-185-6609
NSN 6320-00-098-2858
NSN 5985-01-629-9603
NSN 5990-01-521-7890
NSN 6150-01-434-1244
NSN 6150-00-136-6496