0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5990-00-369-1058
NSN 4140-01-028-8074
NSN 5965-00-823-8623
NSN 5996-00-921-8612
NSN 5965-01-477-6665
NSN 6150-01-234-1910
NSN 5965-01-095-1926
NSN 5925-01-184-0633
NSN 5935-00-190-3366
NSN 5945-00-081-5116
NSN 5945-01-627-1822
NSN 6110-01-328-0646