0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5935-01-398-4488
NSN 6610-00-504-2839
NSN 5930-00-164-5274
NSN 5999-01-612-0890
NSN 5895-01-486-3630
NSN 5905-00-171-2652
NSN 5835-00-898-0201
NSN 6320-00-636-0922
NSN 5975-00-618-0161
NSN 6320-01-123-2476
NSN 5855-01-062-5655
NSN 6135-01-365-2707