0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6105-01-302-0573
NSN 4140-00-186-3062
NSN 5930-01-588-9124
NSN 5975-01-355-7143
NSN 6105-01-365-8006
NSN 6610-00-511-6201
NSN 5998-00-416-6950
NSN 5930-00-579-2281
NSN 5996-01-314-5844
NSN 5930-00-256-0699
NSN 5998-01-484-9764
NSN 5895-00-026-1749